Degradation von MOS-Bauelementen durch optische Generation von Ladungsträgern / von Stefan Scharf. [Hahn-Meitner-Institut Berlin GmbH]
Resource type: Ressourcentyp: BuchBookLanguage: German Series: Hahn-Meitner-Institut. HMI-Berichte ; 530Publisher: Berlin : HMI, 1995Description: 125 S. : graph. DarstReport number: HMI B 530Subject(s): Genre/Form: Action note:- 2
| Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Nord | Geschlossenes Magazin | CN HMI-B-530 | Available | 53649722090 |
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