Zerstörungsfreie 3-dimensionale Defektlokalisierung an System-in-Packages (SIP) mittels Lock-in-Thermographie / Christian Schmidt
Resource type: Ressourcentyp: BuchBookLanguage: German Publisher: 2013Description: VIII, 118 S. : Ill., graph. DarstReport number: 623/2012; 623 2012Subject(s): Genre/Form: RVK: RVK: ZQ 3820Dissertation note: Halle-Wittenberg, Univ., Diss., 2013 Call number: Grundsignatur: 2013 A 5690PPN: PPN: 1606158570Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
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Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 2013 A 5690 | Available | 51894338090 |
Total holds: 0