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Neural models and algorithms for digital testing / by Srimat T. Chakradhar; Vishwani D. Agrawal; Michael L. Bushnell
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 140 : VLSI, computer architecture and digital signal processingPublisher: Boston : Kluwer Academic Publishers, 1991Description: XII, 184 SISBN:- 0792391659
- 621.39'5
- 621.39/5
- 621.395
- TK7868.L6
- 2
| Item type | Home library | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 92 A 1595 | Available | 45203035090 |
Total holds: 0
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