Assessing fault model and test quality / by Kenneth M. Butler and M. Ray Mercer

By:

Contributor(s):

Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 157 : VLSI, computer architecture and digital signal processingPublisher: Boston [u.a.] : Kluwer Acad. Publ., 1992Description: XVIII, 132 SISBN:

Subject(s):

DDC classification:

RVK: RVK: ST 190LOC classification:

Action note:

Call number: Grundsignatur: 92 A 1630PPN: PPN: 1607474476

Holdings
Item type	Home library	Shelving location	Call number	Status	Date due	Barcode	Item holds
Magazinbestand ausleihbar	Bibliothek Campus Süd	Geschlossenes Magazin	92 A 1630	Available		45203999090

Total holds: 0

Archivierung prüfen 20200919 DE-640 2 pdager