Assessing fault model and test quality / by Kenneth M. Butler and M. Ray Mercer
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 157 : VLSI, computer architecture and digital signal processingPublisher: Boston [u.a.] : Kluwer Acad. Publ., 1992Description: XVIII, 132 SISBN:- 0792392221
- 621.3815
- 621.381/5
- TK7874
- 2
Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|
Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 92 A 1630 | Available | 45203999090 |
Total holds: 0
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