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Assessing fault model and test quality / by Kenneth M. Butler and M. Ray Mercer

By: Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 157 : VLSI, computer architecture and digital signal processingPublisher: Boston [u.a.] : Kluwer Acad. Publ., 1992Description: XVIII, 132 SISBN:
  • 0792392221
Subject(s): DDC classification:
  • 621.3815
  • 621.381/5
RVK: RVK: ST 190LOC classification:
  • TK7874
Action note:
  • 2
Call number: Grundsignatur: 92 A 1630PPN: PPN: 1607474476
Item type Home library Shelving location Call number Status Date due Barcode Item holds
Magazinbestand ausleihbar Bibliothek Campus Süd Geschlossenes Magazin 92 A 1630 Available 45203999090
Total holds: 0

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