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Integrated circuit defect sensitivity : theory and computational models / José Pineda De Gyvez
Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 208Publisher: Boston [u.a.] : Kluwer Academic Publishers, 1993Description: XXIV, 167 S. : graph. DarstISBN:- 0792393066
- defect-sensitivity
- 621.3815
- TK7874
- 1
| Item type | Home library | Collection | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|---|
| Freihandbestand ausleihbar | Bibliothek Campus Süd | nach 8.22 | Lesesaal Technik (LST) | 93 A 1601 | Available | 45493962090 |
Total holds: 0
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