Custom cover image
Custom cover image

Integrated circuit defect sensitivity : theory and computational models / José Pineda De Gyvez

By: Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 208Publisher: Boston [u.a.] : Kluwer Academic Publishers, 1993Description: XXIV, 167 S. : graph. DarstISBN:
  • 0792393066
Other title:
  • defect-sensitivity
Subject(s): DDC classification:
  • 621.3815
RVK: RVK: ST 190LOC classification:
  • TK7874
Action note:
  • 1
Call number: Grundsignatur: 93 A 1601PPN: PPN: 1613916485
Holdings
Item type Home library Collection Shelving location Call number Status Barcode
Freihandbestand ausleihbar Bibliothek Campus Süd nach 8.22 Lesesaal Technik (LST) 93 A 1601 Available 45493962090
Total holds: 0

Archivierung prüfen 20200919 DE-640 1 pdager