Proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures : March 23 - 26, 1998, Kanazawa, Japan ; [volume 11] / sponsored by the IEEE Electron Devices Society

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Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Piscataway, NJ : IEEE Service Center, 1998Description: x, 240 p : ill ; 30 cmISBN:

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Call number: Grundsignatur: 99 E 394PPN: PPN: 1631943022

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Item type	Home library	Collection	Shelving location	Call number	Status	Barcode
Freihandbestand ausleihbar	Bibliothek Campus Süd	nach 8.24	Lesesaal Technik (LST)	99 E 394	Available	09042603930

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