Lifetime Spectroscopy : a Method of Defect Characterization in Silicon for Photovoltaic Applications / by Stefan Rein

By:

Rein, Stefan [aut]

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Springer Series in Material Science ; 85 | SpringerLink BücherPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005Description: Online-Ressource (XXVI, 489 p. 153 illus, digital)ISBN:

9783540279228

Subject(s):

Additional physical formats: 9783540253037 | Buchausg. u.d.T.: Lifetime spectroscopy. Berlin : Springer, 2005. XXVI, 489 SeitenRVK: RVK: ZN 3460LOC classification:

QC176-176.9

DOI: DOI: 10.1007/3-540-27922-9Online resources:

PPN: PPN: 1645229793Package identifier: Produktsigel: ZDB-2-PHA

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