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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces / by Gerd Kaupp

Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SpringerLink BücherPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Description: Online-Ressource (XII, 292 p. 239 illus, digital)ISBN:
  • 9783540284727
Subject(s): Additional physical formats: 9783540284055 | Buchausg. u.d.T.: Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching. Berlin : Springer, 2006. XII, 292 S.DDC classification:
  • 530
RVK: RVK: UH 6300DOI: DOI: 10.1007/978-3-540-28472-7Online resources: PPN: PPN: 1645460967Package identifier: Produktsigel: ZDB-1-SCM | ZDB-2-CMS
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