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Proceedings of the 1994 International Conference on Microelectronic Test Structures : March 22 - 25, 1994, San Diego, California
Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Piscataway, NJ : IEEE Service Center, 1994Description: XI, 234 S. : Ill., graph. DarstISBN:- 0780317572
- 0780317580
- 0780317599
- 621.3815/48
- 1
| Item type | Home library | Collection | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|---|
| Freihandbestand ausleihbar | Bibliothek Campus Süd | nach 8.24 | Lesesaal Technik (LST) | 95 E 104 | Available | 47511596090 |
Total holds: 0
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