Progress in Pattern Recognition, Image Analysis and Applications : 13th Iberoamerican Congress on Pattern Recognition, CIARP 2008, Havana, Cuba, September 9-12, 2008. Proceedings / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, José Ruiz-Shulcloper, Walter G. Kropatsch
Contributor(s):- Hutchison, David [oth]
- Pandu Rangan, C [oth]
- Ruiz-Shulcloper, José [oth]
- Steffen, Bernhard [oth]
- Sudan, Madhu [oth]
- Terzopoulos, Demetri [oth]
- Tygar, Doug [oth]
- Vardi, Moshe Y [oth]
- Weikum, Gerhard [oth]
- Kanade, Takeo [oth]
- Kittler, Josef [oth]
- Kleinberg, Jon [oth]
- Kropatsch, Walter G [oth]
- Mattern, Friedemann [oth]
- Mitchell, John C [oth]
- Naor, Moni [oth]
- Nierstrasz, Oscar [oth]
- 9783540859208
- Mustererkennung
- Maschinelles Sehen
- Bildanalyse
- Sprachverarbeitung
- Dokumentanalyse
- Computer science
- Computer graphics
- Pattern recognition systems
- Image processing
- Biometric identification
- Computer Science
- Artificial intelligence
- Computer vision
- Optical pattern recognition
- Biometrics
- Pattern recognition systems
- 004
- 610
- 006.4
- 570
- 004 610 570
- Q337.5 TK7882.P3
- TK7882.P3
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