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Microscopy of Semiconducting Materials 2007 / edited by A. G. Cullis, P. A. Midgley

Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Springer Proceedings in Physics ; 120 | SpringerLink BücherPublisher: Dordrecht : Springer Netherlands, 2008Description: Online-Ressource (XIV + 498 pp, digital)ISBN:
  • 9781402086151
Subject(s): Genre/Form: Additional physical formats: 9781402086144 | Buchausg. u.d.T.: Microscopy of semiconducting materials 2007. Dordrecht : Springer, 2008. XIV, 497 S.DDC classification:
  • 620.11
  • 537.622
RVK: RVK: UH 6200 | UP 8000 | UP 3050LOC classification:
  • TA401-492
  • QC611.6.M5M5 2007
DOI: DOI: 10.1007/978-1-4020-8615-1Online resources:
Contents:
EBIC Characterisation of Diffusion and Recombination of Minority Carriers in GaN-Based LEDs; A Parametric Study of a Diode-Resistor Contrast Model for SEM-REBIC of Electroceramics;
Summary: P. A. MidgleySummary: Covers The fifteenth international conference on Microscopy of Semiconducting Materials. This title focuses on the advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy, scanning probe microscopy and X-ray-based methodsPPN: PPN: 1647668255Package identifier: Produktsigel: ZDB-1-SCM | ZDB-2-CMS
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