Custom cover image
Beam injection assessment of defects in semiconductors : international workshop; Meudon-Bellevue, France, 18 - 19 - 20 July, 1988 / BIADS
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Colloque de physique ; 1989,6Publisher: Les Ulis : Éditions de Physique, 1989Description: XII, 192 S. : Ill., graph. DarstISBN:- 2868831257
- 530.4
| Item type | Home library | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 89 E 602 | Available | 47994042090 |
Total holds: 0