Pattern Recognition and Image Analysis : 4th Iberian Conference, IbPRIA 2009 Póvoa de Varzim, Portugal, June 10-12, 2009 Proceedings / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Helder Araujo, Ana Maria Mendonça, Armando J. Pinho, María Inés Torres
Contributor(s):- Hutchison, David [oth]
- Nierstrasz, Oscar [oth]
- Pandu Rangan, C [oth]
- Pinho, Armando J [oth]
- Steffen, Bernhard [oth]
- Sudan, Madhu [oth]
- Terzopoulos, Demetri [oth]
- Torres, María Inés [oth]
- Tygar, Doug [oth]
- Vardi, Moshe Y [oth]
- Weikum, Gerhard [oth]
- Araujo, Helder [oth]
- Kanade, Takeo [oth]
- Kittler, Josef [oth]
- Kleinberg, Jon [oth]
- Mattern, Friedemann [oth]
- Mendonça, Ana Maria [oth]
- Mitchell, John C [oth]
- Naor, Moni [oth]
- 9783642021725
- Mustererkennung
- Bildanalyse
- Maschinelles Sehen
- Computer science
- Text processing (Computer science
- Optical pattern recognition
- Computer Science
- Artificial intelligence
- Computer vision
- Computer graphics
- Image processing
- Natural language processing (Computer science)
- Pattern recognition systems
- Pattern recognition systems
- 006.42
- 006.37
- 006.4
- 006.37 006.42
- 004
- Q337.5 TK7882.P3
- TA1650
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