Hierarchical modeling for VLSI circuit testing / by Debashis Bhattacharya and John P. Hayes

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Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 89 : VLSI, computer architecture and digital signal processingPublisher: Boston [u.a.] : Kluwer, 1990Description: X, 159 SISBN:

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RVK: RVK: ST 190Local classification: Lokale Notation: Bv 33 | Bv 29LOC classification:

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Call number: Grundsignatur: 90 A 3409PPN: PPN: 1651390703

Holdings
Item type	Home library	Shelving location	Call number	Status	Barcode
Magazinbestand ausleihbar	Bibliothek Campus Süd	Geschlossenes Magazin	90 A 3409	Available	46165542090

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