Electro-Chemo-Mechanics of Solids / edited by Sean R. Bishop, Nicola H. Perry, Dario Marrocchelli, Brian W. Sheldon

Contributor(s):

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Electronic Materials: Science & Technology | SpringerLink Bücher | Springer eBook Collection Chemistry and Materials SciencePublisher: Cham : Springer, 2017Description: Online-Ressource (VII, 192 p. 71 illus., 50 illus. in color, online resource)ISBN:

9783319514079

Subject(s):

Additional physical formats: 9783319514055 | Druckausg.: 978-3-319-51405-5 | Printed edition: 9783319514055 LOC classification:

TA401-TA492

DOI: DOI: 10.1007/978-3-319-51407-9Online resources:

Summary: This book brings together a collection of chapters that focus on the relationship among electrical, chemical, and mechanical properties and the study of adjusting one property through the control of another, namely, Electro-Chemo-Mechanics (ECM). The authors examine how this relationship can result in beneficial properties, such as mixed ionic and electronic conductivity, in oxides, upon oxygen deficiency or lithium insertion (electro-chemo) and/or changes in ionic and electronic mobility observed in strained systems (electro-mechano). They also consider how ECM interactions can be responsible for large stresses from non-stoichiometry induced lattice dilation (chemo-mechano). While many volumes are available devoted to the study of the origins and characteristics of electro-chemical relationships, they form the well-known field of electrochemistry, this volume is highly novel in its examination of the corresponding electro-mechanical, chemo-mechanical, and electro-chemo-mechanical relationships. The book is ideal for researchers and design engineers interested in energy storage and conversion and the electrical and mechanical properties of materialsSummary: Introduction -- Conventional Methods for Measurements of Chemo-Mechanical Coupling -- In-situ High-Temperature X-ray Diffraction of Thin Films: Chemical Expansion and Kinetics -- In-situ Neutron Diffraction Experiments -- In situ Wafer Curvature Relaxation Measurements to Determine Surface Exchange Coefficients and Thermo-Chemically Induced Stresses -- Exploring electro-Chemo-Mechanical Phenomena on the Nanoscale Using Scanning Probe Microscopy -- Continuum Level Transport and Electro-Chemo-Mechanics Coupling-Solid Oxide Fuel Cells and Lithium Ion BatteriesPPN: PPN: 1657557286Package identifier: Produktsigel: ZDB-2-CMS

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