Metrology and Physical Mechanisms in New Generation Ionic Devices / by Umberto Celano

Von:

Celano, Umberto [aut]

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Springer Theses, Recognizing Outstanding Ph.D. Research | SpringerLink BücherVerlag: [Cham] : Springer, 2016Beschreibung: Online-Ressource (XXIV, 175 p. 96 illus., 18 illus. in color, online resource)ISBN:

9783319395319

Schlagwörter:

Genre/Form:

Hochschulschrift

Andere physische Formen: 9783319395302 | Erscheint auch als: 978-3-319-39530-2 Druck-AusgabeDDC-Klassifikation:

621.36

LOC-Klassifikation:

QC450-467 QC718.5.S6
QC450-467
QC718.5.S6

DOI: DOI: 10.1007/978-3-319-39531-9Online-Ressourcen:

Zusammenfassung: Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. .Zusammenfassung: The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .PPN: PPN: 1657737217Package identifier: Produktsigel: ZDB-2-SEB | ZDB-2-SXP | ZDB-2-PHA

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