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Enhanced Surface Imaging of Crustal Deformation : Obtaining Tectonic Force Fields Using GPS Data / by A. John Haines, Lada L. Dimitrova, Laura M. Wallace, Charles A. Williams

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SpringerBriefs in Earth Sciences | SpringerLink BücherPublisher: Cham ; s.l. : Springer International Publishing, 2015Edition: 1st ed. 2015Description: Online-Ressource (X, 99 p. 50 illus., 37 illus. in color, online resource)ISBN:
  • 9783319215785
Subject(s): Additional physical formats: 9783319215778 | Druckausg.: Enhanced surface imaging of crustal deformation. Cham : Springer, 2015. X, 99 S.MSC: MSC: *86-02 | 86A30 | 86A15 | 00A79LOC classification:
  • QC801-809
DOI: DOI: 10.1007/978-3-319-21578-5Online resources:
Summary: 1. Introduction.- 2. Introduction to the Vertical Derivatives of Horizontal Stress (VDoHS) Rates -- 3. Inversion Methodology -- 4. 1-Dimensional Synthetic Examples -- 5. Application to Central South Island, New Zealand -- 6. 2-Dimensional Examples -- 7. Concluding Remarks.Summary: This book takes an in depth look at a novel methodology for analyzing Global Positioning System (GPS) data to obtain the highest possible resolution surface imaging of tectonic deformation sources without prescribing the nature of either the sources or the subsurface medium. GPS methods are widely used to track the surface expression of crustal deformation at tectonic plate boundaries, and are typically expressed in terms of velocity fields or strain rate fields. Vertical derivatives of horizontal stress (VDoHS) rates at the Earth’s surface can also be derived from GPS velocities, and VDoHS rates provide much higher resolution information about subsurface deformation sources than velocities or strain rates. In particular, VDoHS rates allow for high precision estimates of fault dips, slip rates and locking depths, as well as objective characterization of previously unknown (or hidden) tectonic deformation zones.PPN: PPN: 1657873110Package identifier: Produktsigel: ZDB-2-SEB | ZDB-2-SXEE | ZDB-2-EES
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