Fundamentals of Bias Temperature Instability in MOS Transistors : Characterization Methods, Process and Materials Impact, DC and AC Modeling / edited by Souvik Mahapatra
Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Springer Series in Advanced Microelectronics ; 139 | SpringerLink Bücher | Springer eBook Collection EngineeringPublisher: New Delhi : Springer, 2016Description: Online-Ressource (XVI, 269 p. 201 illus., 67 illus. in color, online resource)ISBN:- 9788132225089
- TK7888.4
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