VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers / edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh

Mitwirkende(r):

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Communications in Computer and Information Science ; 711 | SpringerLink Bücher | Springer eBook Collection Computer ScienceVerlag: Singapore : Springer, 2017Beschreibung: Online-Ressource (XXI, 815 p. 486 illus, online resource)ISBN:

9789811074707

Schlagwörter:

Andere physische Formen: 9789811074691 | Erscheint auch als: 978-981-10-7469-1 Druck-Ausgabe | Printed edition: 9789811074691 LOC-Klassifikation:

QA75.5-76.95 TK7885-7895
QA75.5-76.95
TK7885-7895

DOI: DOI: 10.1007/978-981-10-7470-7Online-Ressourcen:

Zusammenfassung: This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verificationZusammenfassung: Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verificationPPN: PPN: 165862162XPackage identifier: Produktsigel: ZDB-2-SCS

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