Reliability, maintainability and risk : practical methods for engineers / Dr.David J. Smith (BSc, PhD, CEng, FIET,FCQI, HonFSaRs MIGEM)

Von:

Smith, David John, 1943- [VerfasserIn]

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Verlag: Oxford ; Cambridge, MA : Butterworth-Heinemann, [2017]Auflage: Ninth editionBeschreibung: 1 Online-RessourceISBN:

0081020228

Schlagwörter:

Andere physische Formen: 9780081020104 | Erscheint auch als: Reliability, maintainability and risk. Druck-Ausgabe Ninth edition. Oxford : Elsevier, Butterworth-Heinemann, 2017. xxi, 454 SeitenDDC-Klassifikation:

620.00452 23

RVK: RVK: ZG 9270 | ZM 9310LOC-Klassifikation:

TA169

Online-Ressourcen:

Zugang im Netz des KIT

Zusammenfassung: Appendix 7 -- Fatality ratesAppendix 8 -- Answers to Exercises; Bibliography; Appendix 10 -- Scoring Criteria for BETAPLUS Common Cause Model; Appendix 11 -- Example of HAZOP; Appendix 12 -- HAZID Checklist; Appendix 13 -- Markov Analysis of Redundant SystemsZusammenfassung: Cover; Reliability, Maintainabilityand Risk; copyright; Contents; Preface; Acknowledgements; Part 1 -- Understanding ReliabilityParameters and Costs; Part 2 -- Interpreting Failure Rates; Part 3 -- Predicting Reliability and Risk; Part 4 -- Achieving Reliabilityand Maintainability; Part 5 -- Legal, Management and Safety Considerations; Appendix 1 -- Glossary; Appendix 2 -- Percentage Points of theChi-Square Distribution; Appendix 3 -- Microelectronics Failure Rates; Appendix 4 -- General Failure Rates; Appendix 5 -- Failure mode percentages; Appendix 6 -- Human Error ProbabilitiesPPN: PPN: 1679464779Package identifier: Produktsigel: ZDB-4-EBA | ZDB-4-NLEBK

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