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Automated Visual Inspection and Machine Vision III : 27 June 2019, Munich, Germany / Jürgen Beyerer, Fernando Puente León (editors) ; sponsored and published by: SPIE

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 11061Publisher: Bellingham, Washington, USA : SPIE, [2019]Description: 1 Online-Ressource : IllustrationenISBN:
  • 9781510628021
Other title:
  • SPIE Optical Metrology 24th Twenty-fourth World of Photonics Congress International on in Europe München
Genre/Form: Additional physical formats: 9781510628014 Online resources: PPN: PPN: 1679748599Package identifier: Produktsigel: ZDB-1-SPIE
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