Advances in Metrology for X-Ray and EUV Optics VIII : 11-12 August 2019, San Diego, California, United States / Lahsen Assoufid, Haruhiko Ohashi, Anand Asundi (editors) ; sponsored and published by: SPIE

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Advances in Metrology for X-Ray and EUV Optics (Veranstaltung) : (2019 : San Diego, Calif.) [VerfasserIn]

Contributor(s):

Assoufid, Lahsen [HerausgeberIn]
Ohashi, Haruhiko [HerausgeberIn]
Asundi, Anand [HerausgeberIn]
SPIE [Herausgebendes Organ, SponsorIn]

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 11109Publisher: Bellingham, Washington, USA : SPIE, [2019]Description: 1 Online-Ressource : IllustrationenISBN:

9781510629127

Other title:

SPIE Optical Engineering + Applications Photonics

Subject(s):

Röntgenoptik
Extremes Ultraviolett
Synchrotronstrahlung
Geometrische Optik
Messung

Genre/Form:

Konferenzschrift

Additional physical formats: 9781510629110 Online resources:

Zugang im Netz des KIT
Zugang im Netz der HKA

PPN: PPN: 1680687700Package identifier: Produktsigel: ZDB-1-SPIE

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