Applied Optical Metrology III : 13-15 August 2019, San Diego, California, United States / Erik Novak, James D. Trolinger (editors) ; sponsored and published by: SPIE

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Applied Optical Metrology (Veranstaltung) : (2019 : San Diego, Calif.) [VerfasserIn]

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Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 11102Publisher: Bellingham, Washington, USA : SPIE, [2019]Description: 1 Online-Ressource : IllustrationenISBN:

9781510628984

Other title:

SPIE Engineering + Applications Optics Photonics

Subject(s):

Optische Messtechnik

Genre/Form:

Konferenzschrift

Additional physical formats: 9781510628977 Online resources:

PPN: PPN: 1682362027Package identifier: Produktsigel: ZDB-1-SPIE

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