APA

Applied Optical Metrology, Novak E., Trolinger J. D. & SPIE. (2019). Applied Optical Metrology III. Bellingham, Washington, USA: SPIE.

Chicago

Applied Optical Metrology, Novak Erik, Trolinger James D and SPIE. 2019. Applied Optical Metrology III. Bellingham, Washington, USA: SPIE.

Harvard

Applied Optical Metrology, Novak E., Trolinger J. D. and SPIE. (2019). Applied Optical Metrology III. Bellingham, Washington, USA: SPIE.

MLA

Applied Optical Metrology, Novak Erik, Trolinger James D and SPIE. Applied Optical Metrology III. Bellingham, Washington, USA: SPIE. 2019.