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Applied Optical Metrology III : 13-15 August 2019, San Diego, California, United States / Erik Novak, James D. Trolinger (editors) ; sponsored and published by: SPIE

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 11102Publisher: Bellingham, Washington, USA : SPIE, [2019]Description: 1 Online-Ressource : IllustrationenISBN:
  • 9781510628984
Other title:
  • SPIE Engineering + Applications Optics Photonics
Subject(s): Genre/Form: Additional physical formats: 9781510628977 Online resources: PPN: PPN: 1682362027Package identifier: Produktsigel: ZDB-1-SPIE
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