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Optics and Photonics for Advanced Dimensional Metrology : 6-10 April 2020, online only, France / Peter J. de Groot, Richard K. Leach, Pascal Picart (editors) ; sponsored by: SPIE

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 11352Publisher: Bellingham, Washington, USA : SPIE, [2020]Description: 1 Online-Ressource : IllustrationenISBN:
  • 9781510634770
Other title:
  • SPIE Europe Digital Forum
Genre/Form: Additional physical formats: 9781510634763 Online resources: PPN: PPN: 1698063067Package identifier: Produktsigel: ZDB-1-SPIE
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