Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings / edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly
Mitwirkende(r): Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 12644Verlag: Cham : Springer International Publishing, 2021Verlag: Cham : Imprint: Springer, 2021Auflage: 1st ed. 2021Beschreibung: 1 Online-Ressource(XII, 378 p. 103 illus., 84 illus. in color.)ISBN:- 9783030739737
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