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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings / edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly

Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 12644Publisher: Cham : Springer International Publishing, 2021Publisher: Cham : Imprint: Springer, 2021Edition: 1st ed. 2021Description: 1 Online-Ressource(XII, 378 p. 103 illus., 84 illus. in color.)ISBN:
  • 9783030739737
Subject(s): Additional physical formats: 9783030739720 | 9783030739744 | Erscheint auch als: 9783030739720 Druck-Ausgabe | Erscheint auch als: 9783030739744 Druck-AusgabeDDC classification:
  • 006.3 23
DOI: DOI: 10.1007/978-3-030-73973-7Online resources: Summary: Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.Summary: This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.PPN: PPN: 1756966419Package identifier: Produktsigel: ZDB-2-LNC | ZDB-2-SCS | ZDB-2-SXCS | ZDB-2-SEB
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