RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

Von:

Müller, Daniel [VerfasserIn]

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und ElektronikVerlag: [Erscheinungsort nicht ermittelbar] : KIT Scientific Publishing, 2018Beschreibung: 1 Online-Ressource (XII, 180 p.)ISBN:

9783731508229

Online-Ressourcen:

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Zusammenfassung: Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortionsPPN: PPN: 1778524141Package identifier: Produktsigel: ZDB-94-OAB

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