Thermal Reliability of Power Semiconductor Device in the Renewable Energy System / by Xiong Du, Jun Zhang, Gaoxian Li, Yaoyi Yu, Cheng Qian, Rui Du

By:

Du, Xiong [VerfasserIn]

Contributor(s):

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: CPSS Power Electronics SeriesPublisher: Singapore : Springer Nature Singapore, 2022Publisher: Singapore : Imprint: Springer, 2022Edition: 1st ed. 2022Description: 1 Online-Ressource(XVI, 172 p. 121 illus., 94 illus. in color.)ISBN:

9789811931321

Subject(s):

Additional physical formats: 9789811931314 | 9789811931338 | 9789811931345 | Erscheint auch als: 9789811931314 Druck-Ausgabe | Erscheint auch als: 9789811931338 Druck-Ausgabe | Erscheint auch als: 9789811931345 Druck-AusgabeDOI: DOI: 10.1007/978-981-19-3132-1Online resources:

Summary: Introduction -- Thermal fatigue failure mechanism of power devices in renewable energy system -- Thermal model and thermal parameters monitoring -- Thermal analysis of power semiconductor device in renewable energy system -- Multi-time scale lifetime evaluation for the device in the renewable application -- Thermal management design and optimization -- Prospect.Summary: This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. .PPN: PPN: 1809938732Package identifier: Produktsigel: ZDB-2-ENE | ZDB-2-SEB | ZDB-2-SXEN

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