Custom cover image
Custom cover image

Enhanced Virtual Prototyping for Heterogeneous Systems / by Muhammad Hassan, Daniel Große, Rolf Drechsler

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Springer eBook CollectionPublisher: Cham : Springer International Publishing, 2023Publisher: Cham : Imprint: Springer, 2023Edition: 1st ed. 2023Description: 1 Online-Ressource(XX, 166 p. 63 illus., 59 illus. in color.)ISBN:
  • 9783031055744
Subject(s): Additional physical formats: 9783031055737 | 9783031055751 | 9783031055768 | Erscheint auch als: 9783031055737 Druck-Ausgabe | Erscheint auch als: 9783031055751 Druck-Ausgabe | Erscheint auch als: 9783031055768 Druck-AusgabeDDC classification:
  • 621.3815 23
DOI: DOI: 10.1007/978-3-031-05574-4Online resources: Summary: Introduction -- Preliminaries -- AMS Metamorphic Testing Environment -- AMS Enhanced Code Coverage Verification Environment -- AMS Enhanced Functional Coverage Verification Environment -- Digital Early Security Validation -- Conclusion.Summary: This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security. Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs; Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models; Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs; Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.PPN: PPN: 1815864311Package identifier: Produktsigel: ZDB-2-SEB | ZDB-2-ENG | ZDB-2-SXE
No physical items for this record
KIT – The Research University in the Helmholtz Association                         Home | Impressum | Datenschutz | Barrierefreiheit | KIT