Microstructural Characterisation Techniques / by Gunturi Venkata Sitarama Sastry

By:

Sastry, Gunturi Venkata Sitarama [VerfasserIn]

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Indian Institute of Metals SeriesPublisher: Singapore : Springer Nature Singapore, 2022Publisher: Singapore : Imprint: Springer, 2022Edition: 1st ed. 2022Description: 1 Online-Ressource(XVII, 242 p. 209 illus., 60 illus. in color.)ISBN:

9789811935091

Subject(s):

Additional physical formats: 9789811935084 | 9789811935107 | 9789811935114 | Erscheint auch als: 9789811935084 Druck-Ausgabe | Erscheint auch als: 9789811935107 Druck-Ausgabe | Erscheint auch als: 9789811935114 Druck-AusgabeDOI: DOI: 10.1007/978-981-19-3509-1Online resources:

Summary: Introduction -- Electromagnetic Waves and Electron Waves -- Fourier Analysis and Fourier Transformation -- Transmission Electron Microscope -- Electron Diffraction -- Optical Microscopy -- Transmission Electron Microscopy -- Lens-less Electron Microscopy.Summary: This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.PPN: PPN: 1816989460Package identifier: Produktsigel: ZDB-2-SEB | ZDB-2-CMS | ZDB-2-SXC

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