APA

Agrawal V. D., Seth S. C. & Institute of Electrical and Electronics Engineers. (1988). Tutorial: Test generation for VLSI chips. Washington, DC: IEEE Computer Society Press.

Chicago

Agrawal Vishwani D, Seth Sharad C and Institute of Electrical and Electronics Engineers. 1988. Tutorial: Test generation for VLSI chips. Washington, DC: IEEE Computer Society Press.

Harvard

Agrawal V. D., Seth S. C. and Institute of Electrical and Electronics Engineers. (1988). Tutorial: Test generation for VLSI chips. Washington, DC: IEEE Computer Society Press.

MLA

Agrawal Vishwani D, Seth Sharad C and Institute of Electrical and Electronics Engineers. Tutorial: Test generation for VLSI chips. Washington, DC: IEEE Computer Society Press. 1988.