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Tutorial: Test generation for VLSI chips / Vishwani D. Agrawal ... The Institute of Electrical and Electronics Engineers
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Washington, DC : IEEE Computer Society Press, 1988Description: X, 401 S : graph. DarstISBN:- 081868786X
- 0818647868
- Nebent.: Test generation for VLSI chips
- Test generation for VLSI chips
- 621.3950287
- 621.39/5/0287 20
- TK7874
Contents:
PPN: PPN: 016959701
| Item type | Home library | Call number | Status | |
|---|---|---|---|---|
| Institutsbestand | ITIV | IB-2631 | Not for loan |
Total holds: 0