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Developments in integrated circuit testing / D.M. Miller, ed.
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Perspectives in computing ; 18Publisher: London [u.a.] : Academic Pr., 1987Description: X, 440 S. : Ill. ; 23 cmISBN:- 0124967353
- 621.381'71
- 621.381/5/0287
- 621.38150287
- TK7874
- 1
| Item type | Home library | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 88 A 2041 | Available | 46832579090 |
Total holds: 0
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