Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices : Special topic volume with invited peer-reviewed papers only / edited by Juraj Marek, Gregor Pobegen and Ulrike Grossner
Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Defect and Diffusion Forum ; Vol. 426Publisher: Switzerland : Trans Tech Publications Ltd, 2023Description: 1 Online-RessourceISBN:- 9783036413327
- 3036413324
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