Optics and Photonics for Advanced Dimensional Metrology III : 9-11 April 2024, Strasbourg, France / Peter J. de Groot, Felipe Guzman, Pascal Picart (editors) ; sponsored by: SPIE
Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 12997Publisher: Bellingham, Washington, USA : SPIE, [2024]Description: 1 Online-Ressource : IllustrationenISBN:- 9781510673137
- SPIE Photonics Europe Straßburg
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