Dimensional Optical Metrology and Inspection for Practical Applications XIII : 21-25 April 2024, National Harbor, Maryland, United States / Kevin G. Harding, Song Zhang, Jae-Sang Hyun, Beiwen Li, Andrés G. Marrugo (editors) ; sponsored and published by: SPIE

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Dimensional Optical Metrology and Inspection for Practical Applications (Veranstaltung) : (2024 : National Harbor, Md.) [VerfasserIn]

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Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 13038Publisher: Bellingham, Washington, USA : SPIE, [2024]Description: 1 Online-Ressource : IllustrationenISBN:

9781510673953

Other title:

SPIE Defense Commercial Sensing

Subject(s):

Optische Messtechnik

Genre/Form:

Konferenzschrift

Additional physical formats: 9781510673946 Online resources:

Zugang im Netz des KIT

PPN: PPN: 1896775128Package identifier: Produktsigel: ZDB-1-SPIE

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