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Speckle 2023: VIII International Conference on Speckle Metrology : 18-20 October 2023, Xi'an, China / Weiguo Liu, Wei Wang, Yechuan Zhu (editors) ; organized by: Xi'an Technological University (China) ; co-organized by: Xidian University (China), Xi'an Jiaotong University (China), Changchun University of Science and Technology (China), Nankai University (China), Shenzhen University (China) ; sponsored by: Wuhan Red Star Yang Science and Technology Co., Ltd. (China), Xi'an Startin Optronics Co., Ltd. (China), Xi'an Micromach Technology Co., Ltd. (China), Changchun Institute of Optics, Fine Mechanics, and Physics (China)

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 13070Publisher: Bellingham, Washington, USA : SPIE, [2024]Description: 1 Online-Ressource : IllustrationenISBN:
  • 9781510674592
Other title:
  • 8th Eighth
Subject(s): Genre/Form: Additional physical formats: 9781510674585 Online resources: PPN: PPN: 1883571561Package identifier: Produktsigel: ZDB-1-SPIE
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