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Evaluation of advanced semiconductor materials by electron microscopy : [proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12 - 17, 1988, in Bristol, United Kingdon] / ed. by David Cherns
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: NATO. NATO ASI series / B ; 203Publisher: New York [u.a.] : Plenum Press, 1989Description: XI, 412 S. : Ill., graph. DarstISBN:- 0306433621
- 621.38152
- 530.4/1
- QC611.6.S9
| Item type | Home library | Collection | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Süd | phys 6.24 | Geschlossenes Magazin | 90 E 165 | Available | 44331137090 |
Total holds: 0