Custom cover image
Custom cover image

Pattern Analysis and Machine Intelligence : First International Conference, ICPAMI 2024, Shanghai, China, August 30 – September 1, 2024, Proceedings / edited by Jie Yang, Yuanjie Zheng, Chen Gong

Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Communications in Computer and Information Science ; 2323Publisher: Singapore : Springer Nature Singapore, 2025Publisher: Singapore : Imprint: Springer, 2025Edition: 1st ed. 2025Description: 1 Online-Ressource(XIII, 238 p. 116 illus., 93 illus. in color.)ISBN:
  • 9789819633494
Subject(s): Additional physical formats: 9789819633487 | 9789819633500 | Erscheint auch als: 9789819633487 Druck-Ausgabe | Erscheint auch als: 9789819633500 Druck-AusgabeDDC classification:
  • 006.37 23
DOI: DOI: 10.1007/978-981-96-3349-4Online resources: Summary: This book constitutes the referred proceedings of the First International Conference on Pattern Analysis and Machine Intelligence, ICPAMI 2024, held in Shanghai, China, from August 30 to September 01, 2024. The 28 papers presented here were carefully reviewed and selected from 56 submissions. These papers have been organized under the following topical sections: Computer Vision and Pattern Recognition; Natural Language Processing (NLP) and Machine Learning; Intelligent System and Optimization Algorithm.PPN: PPN: 1920927832Package identifier: Produktsigel: ZDB-2-SEB | ZDB-2-SCS | ZDB-2-SXCS
No physical items for this record
KIT – The Research University in the Helmholtz Association                         Home | Impressum | Datenschutz | Barrierefreiheit | KIT