Quantum Sensing, Imaging, and Precision Metrology III : 25-31 January 2025, San Francisco, California, United States / Selim M. Shahriar (editor) ; sponsored and published by: SPIE

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Quantum Sensing, Imaging, and Precision Metrology (Veranstaltung) : (2025 : San Francisco, Calif.) [VerfasserIn]

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Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 13392 | SPIE. Proceedings of SPIE ; volume PC13392Publisher: Bellingham, Washington, USA : SPIE, [2025]Description: 2 Online-Ressourcen : IllustrationenISBN:

9781510685338

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SPIE West

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Konferenzschrift

Additional physical formats: 9781510685321 Online resources:

Zugang im Netz des KIT

PPN: PPN: 1921786868Package identifier: Produktsigel: ZDB-1-SPIE

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