Reliability of CMOS Analog ICs / by Hakan Kuntman, Deniz Özenli, Fırat Kaçar, Yasin Özçelep

Von:

Kuntman, Hakan [VerfasserIn]

Mitwirkende(r):

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Analog Circuits and Signal ProcessingVerlag: Cham : Springer Nature Switzerland, 2025Verlag: Cham : Imprint: Springer, 2025Auflage: 1st ed. 2025Beschreibung: 1 Online-Ressource(XII, 94 p. 64 illus., 13 illus. in color.)ISBN:

9783031854552

Schlagwörter:

621.3815 23

DOI: DOI: 10.1007/978-3-031-85455-2Online-Ressourcen:

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Zusammenfassung: Introduction -- The reliability model for PMOS and NMOS transistors based on statistical methods -- Demonstration of Proposed Method with Application Examples -- On the degradation of OTA-C–based CMOS low-power filter circuits for biomedical instrumentation -- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.Zusammenfassung: This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications. Presents recent advances in statistical method based reliability estimation of MOS transistors; Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented; Discusses design examples for specific application areas, enabling readers to follow recent advances and trends.PPN: PPN: 1928358802Package identifier: Produktsigel: ZDB-2-SEB | ZDB-2-ENG | ZDB-2-SXE

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