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Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / Tien T. Tsong

By: Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Cambridge [u.a.] : Cambridge University Press, 1990Edition: 1. publDescription: X, 387 S. : Ill., graph. DarstISBN:
  • 0521363799
Subject(s): Additional physical formats: Online-Ausg.: Atom-Probe Field Ion Microscopy. Online-Ausg. Cambridge : Cambridge University Press, 1990. Online-Ressource (1 online resource (400 p.))DDC classification:
  • 502.82
  • 502/.8/2
RVK: RVK: UH 6330Call number: Grundsignatur: 91 A 236PPN: PPN: 276172205
Holdings
Item type Home library Shelving location Call number Status Date due Barcode Item holds
Magazinbestand ausleihbar Bibliothek Campus Süd Geschlossenes Magazin 91 A 236 Available 46180261090
Total holds: 0

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