Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution / Tien T. Tsong
Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Cambridge [u.a.] : Cambridge University Press, 1990Edition: 1. publDescription: X, 387 S. : Ill., graph. DarstISBN:- 0521363799
- 502.82
- 502/.8/2
Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
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Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 91 A 236 | Available | 46180261090 |
Total holds: 0