Proceedings / International Test Conference 1993 : [Designing, testing, and diagnostics - join them ; October 17 - 21, 1993, Convention Center, Baltimore, Maryland, USA]

By:

(24 : International Test Conference (24 : 1993 : Baltimore, Md.) [aut]

Contributor(s):

Institute of Electrical and Electronics Engineers [oth]

Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Piscataway, NJ : IEEE Service Center, 1993Description: XII, 1065 S. : graph. DarstISBN:

0780314298
0780314301
078031431X
0780314301
0818614298
0780314298

Other title:

Nebent.: Designing, testing, and diagnostics - join them

Subject(s):

Genre/Form:

Konferenzschrift -- 1993 -- Baltimore, Md.

DDC classification:

621.3815/028/7
621.38150287

RVK: RVK: SS 1993LOC classification:

TK7874

Action note:

Call number: Grundsignatur: 94 E 338PPN: PPN: 277931436

Holdings ( 1 )
Title notes ( 1 )

Holdings
Item type	Home library	Shelving location	Call number	Status	Date due	Barcode	Item holds
Magazinbestand ausleihbar	Bibliothek Campus Süd	Geschlossenes Magazin	94 E 338	Available		47482310090

Total holds: 0

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