Elektronenmikroskopie : Grundlagen, Methoden, Anwendungen / Stanley L. Flegler; John W. Heckman; Karen L. Klomparens

By:

Flegler, Stanley L [aut]

Contributor(s):

Resource type: Ressourcentyp: BuchBookLanguage: German Publisher: Heidelberg ; Berlin [u.a.] : Spektrum, Akad. Verl., 1995Description: VIII, 279 S. : Ill., graph. DarstISBN:

3860253417

Uniform titles:

Scanning and transmission electron microscopy <dt.>

Contained works:

Flegler, Stanley L. Scanning and transmission electron microscopy <dt.>

Subject(s):

RVK: RVK: ZM 8150 | UH 6300 | ZM 3700 | WC 3100 | UH 5000

Contents:

Call number: Grundsignatur: 95 A 4312PPN: PPN: 278458319

Holdings ( 2 )

Holdings
Item type	Home library	Collection	Shelving location	Call number	Copy number	Status	Date due	Barcode	Item holds
Freihandbestand ausleihbar	Bibliothek Campus Nord	nat 2.12	Lesesaal CN	95 A 4312	;b	Available		50641189090
Freihandbestand ausleihbar	Bibliothek Campus Süd	nat 2.12	Lesesaal Naturwissenschaften (LSN)	95 A 4312		Available		44312938090

Total holds: 0