Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster; W. Hofer

By:

Foster, Adam [aut]

Contributor(s):

Hofer, Werner, 1960- [aut]

Resource type: Ressourcentyp: BuchBookLanguage: English Series: NanoScience and technologyPublisher: New York, NY ; [Heidelberg] : Springer, 2006Description: XIV, 281 S. : Ill., graph. DarstISBN:

9780387400907
9781441923066
0387400907

Subject(s):

Additional physical formats: 9780387372310 | Online-Ausg.: Scanning probe microscopy. New York, NY : Springer, 2006. Online-Ressource | Erscheint auch als: Scanning Probe Microscopy. Online-Ausgabe. New York, NY : Springer New York, 2006. Online-Ressource (XIV, 281 p. 116 illus, digital)DDC classification:

502.82
502.8/2

RVK: RVK: UH 6310LOC classification:

QH212.S33

Contents:

Literaturangaben

Call number: Grundsignatur: 2012 A 3282PPN: PPN: 368354407

Holdings ( 1 )

Holdings
Item type	Home library	Collection	Shelving location	Call number	Status	Date due	Barcode	Item holds
Freihandbestand ausleihbar	Bibliothek Campus Nord	nat 2.12	Lesesaal CN	2012 A 3282	Available		51004912090

Total holds: 0