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Design and analysis of accelerated tests for mission critical reliability / Michael LuValle; Bruce G. Lefevre; SriRaman Kannan
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Boca Raton, FL [u.a.] : Chapman & Hall/CRC, 2004Description: 236 S : Ill., graph. DarstISBN:- 1584884711
- 620/.00452 22
- TA169.3
- TA169.3.L88 2004
- 3
| Item type | Home library | Collection | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|---|
| Freihandbestand ausleihbar | Bibliothek Campus Nord | tech 1.5 | Lesesaal CN | 2014 A 2204 | Available | 51987305090 |
Total holds: 0
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