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Design and analysis of accelerated tests for mission critical reliability / Michael LuValle; Bruce G. Lefevre; SriRaman Kannan

By: Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Boca Raton, FL [u.a.] : Chapman & Hall/CRC, 2004Description: 236 S : Ill., graph. DarstISBN:
  • 1584884711
Subject(s): DDC classification:
  • 620/.00452 22
MSC: MSC: *62N05 | 62-02LOC classification:
  • TA169.3
  • TA169.3.L88 2004
Action note:
  • 3
Call number: Grundsignatur: 2014 A 2204PPN: PPN: 376127643
Holdings
Item type Home library Collection Shelving location Call number Status Barcode
Freihandbestand ausleihbar Bibliothek Campus Nord tech 1.5 Lesesaal CN 2014 A 2204 Available 51987305090
Total holds: 0

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