VLSI test principles and architectures : design for testability / ed. by Laung-Terng Wang; Cheng-Wen Wu...
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: The Morgan Kaufmann series in systems on siliconPublisher: Amsterdam ; Heidelberg [u.a.] : Elsevier, 2006Description: XXX, 777 S : Ill., graph. DarstISBN:- 0123705975
- 9780123705976
- 621.39/5 22
- TK7874.75
- Archivierung/Langzeitarchivierung gewährleistet PEBW
| Item type | Home library | Call number | Status | |
|---|---|---|---|---|
| Institutsbestand | ITIV | IB-3848 | Not for loan |
Total holds: 0
Archivierung/Langzeitarchivierung gewährleistet PEBW DE-31 pdager DE-90