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VLSI test principles and architectures : design for testability / ed. by Laung-Terng Wang; Cheng-Wen Wu...

Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: The Morgan Kaufmann series in systems on siliconPublisher: Amsterdam ; Heidelberg [u.a.] : Elsevier, 2006Description: XXX, 777 S : Ill., graph. DarstISBN:
  • 0123705975
  • 9780123705976
Subject(s): Additional physical formats: Online-Ausg. (ScienceDirect): VLSI test principles and architectures. Amsterdam : Elsevier Morgan Kaufmann Publishers, 2006. Online Ressource (xxx, 777 p.) | Erscheint auch als: VLSI test principles and architectures. Online-Ausgabe. Amsterdam : Elsevier, Morgan Kaufmann Publishers, 2006. 1 Online-Ressource (xxx, 777 Seiten) | Online-Ausg. (MyiLibrary): VLSI test principles and architectures. Amsterdam : Elsevier, Morgan Kaufmann Publishers, 2006. 1 Online-Ressource (xxx, 777 Seiten)DDC classification:
  • 621.39/5 22
RVK: RVK: ZN 4030 | ZN 4950LOC classification:
  • TK7874.75
Action note:
  • Archivierung/Langzeitarchivierung gewährleistet PEBW
PPN: PPN: 50918023X
Holdings
Item type Home library Call number Status
Institutsbestand ITIV IB-3848 Not for loan
Total holds: 0

Archivierung/Langzeitarchivierung gewährleistet PEBW DE-31 pdager DE-90

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