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Reliability and failure of electronic materials and devices / Milton Ohring (Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, New Jersey) with Lucian Kasprzak (IBM Retired, Bear, Delaware)

By: Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Amsterdam ; Bosten ; Heidelberg : Academic Press, an imprint of Elsevier, [2015]Copyright date: © 2015Edition: Second EditionDescription: xxiv, 734 Seiten : Illustrationen, DiagrammeISBN:
  • 0120885743
  • 9780120885749
Subject(s): DDC classification:
  • 621.381
RVK: RVK: ZN 4040Call number: Grundsignatur: 2021 A 1700PPN: PPN: 534541208
Holdings
Item type Home library Shelving location Call number Status Date due Barcode
Handbibliothek IPE Handbibliothek (Ausleihe und Einsicht nicht möglich) 2021 A 1700 Checked out Ausleihe und Einsicht nicht möglich 09.12.2041 53596035090
Total holds: 0