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Reliability and failure of electronic materials and devices / Milton Ohring (Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, New Jersey) with Lucian Kasprzak (IBM Retired, Bear, Delaware)
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: Amsterdam ; Bosten ; Heidelberg : Academic Press, an imprint of Elsevier, [2015]Copyright date: © 2015Edition: Second EditionDescription: xxiv, 734 Seiten : Illustrationen, DiagrammeISBN:- 0120885743
- 9780120885749
- 621.381
| Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Handbibliothek | IPE | Handbibliothek (Ausleihe und Einsicht nicht möglich) | 2021 A 1700 | Checked out Ausleihe und Einsicht nicht möglich | 09.12.2041 | 53596035090 |
Total holds: 0