Custom cover image
Custom cover image

Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: ACM Digital Library | ACM ConferencesPublisher: New York, NY : ACM, 2008Description: Online-Ressource (1 online resource (362 pages))ISBN:
  • 9781595939715
Other title:
  • ESEM '08
Subject(s): Genre/Form: DOI: DOI: 10.1145/1414004Online resources: PPN: PPN: 772435537Package identifier: Produktsigel: ZDB-15-ACM
No physical items for this record

Reproduktion. (Association for Computing Machinery-Digital Library)

KIT – The University in the Helmholtz Association                         Home | Impressum | Datenschutz | Barrierefreiheit | KIT