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Proceedings of the 2nd International Workshop on Defects in Large Software Systems Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: ACM Digital Library | ACM ConferencesPublisher: New York, NY : ACM, 2009Description: Online-Ressource (1 online resource (34 pages))ISBN:
  • 9781605586540
Other title:
  • DEFECTS '09
Subject(s): Genre/Form: DOI: DOI: 10.1145/1555860Online resources: PPN: PPN: 772473609Package identifier: Produktsigel: ZDB-15-ACM
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