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Frontiers in optical methods : nano-characterization and coherent control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno (editors)
Mitwirkende(r): Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Springer series in optical sciences ; 180Verlag: Heidelberg ; New York ; Dordrecht ; London : Springer, [2014]Copyright-Datum: © 2014Beschreibung: 1 Online-Ressource (xii, 228 Seiten)ISBN:- 9783642405945
- 621.36 23
- TA1671-1707
- TA1501-1820
- TA1671-1707 TA1501-1820
Inhalte:
Zusammenfassung: This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of JapanPPN: PPN: 77555314XPackage identifier: Produktsigel: ZDB-2-PHA
State-of-Art of Terahertz Science and TechnologyBroadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films -- Single Photon Counting and Passive Microscopy of Terahertz Radiation -- Coherent Phonons in Carbon Nanotubes -- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation -- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures -- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy -- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring -- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique -- Terahertz Light Source Based on Synchrotron Radiation -- Terahertz Synchrotron Radiation; Optics and Application -- Far-infrared Spectroscopy on Solids under Ultra High Pressures -- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.
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Reproduktion. (Springer eBook Collection. Physics and Astronomy)