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Atomic force microscopy : understanding basic modes and advanced applications / Greg Haugstad

By: Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Publisher: Hoboken, N.J : John Wiley & Sons, c2012Copyright date: ©2012Edition: Online-AusgDescription: Online-Ressource (1 online resource (xxii, 464 p.)) : illISBN:
  • 9781283646024
  • 1283646021
  • 9781118360699
Subject(s): Additional physical formats: 9780470638828 | 9781118360699 | 1283644932 | Erscheint auch als: Atomic force microscopy. Druck-Ausgabe 1. ed. Hoboken, NJ : Wiley, 2012. XXII, 464 S.DDC classification:
  • 620/.5 23
  • 620.5
RVK: RVK: UH 6320LOC classification:
  • QH212.A78
Online resources: Summary: Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications -- Contents -- Preface -- Acknowledgments -- 1. Overview of AFM -- 1.1. The Essence of the Technique -- 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction -- 1.3. Modifying a Surface with a Tip -- 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity -- 1.5. Force Curves Plus Mapping in Liquid -- 1.6. Rate, Temperature, and Humidity-Dependent Characterization -- 1.7. Long-Range Force Imaging Modes -- 1.8. Pedagogy of Chapters -- References -- 2. Distance-Dependent Interactions -- 2.1. General Analogies and Types of Forces -- 2.2. Van der Waals and Electrostatic Forces in a Tip-Sample System -- 2.2.1. Dipole-Dipole Forces -- 2.2.2. Electrostatic Forces -- 2.3. Contact Forces and Mechanical Compliance -- 2.4. Dynamic Probing of Distance-Dependent Forces -- 2.4.1. Importance of Force Gradient -- 2.4.2. Damped, Driven Oscillator: Concepts and Mathematics -- 2.4.3. Effect of Tip-Sample Interaction on Oscillator -- 2.4.4. Energy Dissipation in Tip-Sample Interaction -- 2.5. Other Distance-Dependent Attraction and Repulsion: Electrostatic and Molecular Forces in Air and Liquids -- 2.5.1. Electrostatic Forces in Liquids: Superimposed on Van der Waals Forces -- 2.5.2. Molecular-Structure Forces in Liquids -- 2.5.3. Macromolecular Steric Forces in Liquids -- 2.5.4. Derjaguin Approximation: Colloid Probe AFM -- 2.5.5. Macromolecular Extension Forces (Air and Liquid Media) -- 2.6. Rate/Time Effects -- 2.6.1. Viscoelasticity -- 2.6.2. Stress-Modified Thermal Activation -- 2.6.3. Relevance to Other Topics of Chapter 2 -- References -- 3. Z-Dependent Force Measurements with AFM -- 3.1. Revisit Ideal Concept -- 3.2. Force-Z Measurement Components: Tip/Cantilever/Laser/Photodetector/Z Scanner.PPN: PPN: 809924781Package identifier: Produktsigel: ZDB-26-MYL | ZDB-30-PAD | ZDB-30-PQE
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